2000
ISIS: A Fail-Safe Interface Realized in Smart Power Technology.
Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000

1999
Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS.
Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

1998
Fault Detection for Linear Analog Circuits Using Current Injection.
Proceedings of the 1998 Design, 1998

1995
Upset-Tolerant CMOS SRAM Using Current Monitoring: Prototype and Test Experiments.
Proceedings of the Proceedings IEEE International Test Conference 1995, 1995