Substrate noise measurement by using noise-selective voltage comparators in analog and digital mixed-signal integrated circuits.
IEEE Trans. Instrum. Meas., 1999
Correction to "Voltage-Comparator-Based Measurement of Equivalentiy Samlpled Substrate Noise Wavefor.
IEEE J. Solid State Circuits, 1996
Voltage-comparator-based measurement of equivalently sampled substrate noise waveforms in mixed-signal integrated circuits.
IEEE J. Solid State Circuits, 1996