Redundancy Allocation Problem for a Continuous-State Series-Parallel System With Degrading Components: Electric Vehicle Application.

Stochastic programming on joint optimization of redundancy design and condition-based maintenance for continuously degrading systems subject to uncertain usage stresses.

An adaptive mixture prior in Bayesian convolutional autoencoder for early detecting anomalous degradation behaviors in lithium-ion batteries.

The Prediction of Serum C-Reactive Protein Concentration Using Nonlinear Mixed-Effects Model.

A Proportional Intensity Model with Frailty for Missing Recurrent Failure Data.

A random-effect gamma process model with random initial degradation for accelerated destructive degradation testing data.

On the application of inverted Dirichlet distribution for reliability inference of completely censored components with dependence structure.

Depth-Based Condition Monitoring and Contributing Factor Analysis for Anomalies in Combined Cycle Power Plant.

Reliability modelling for multi-component systems subject to stochastic deterioration and generalized cumulative shock damages.

Superposed Poisson process models with a modified bathtub intensity function for repairable systems.

Two-level differential burn-in policy for spatially heterogeneous defect units in semiconductor manufacturing.

Mixed-Effects Nonhomogeneous Poisson Process Model for Multiple Repairable Systems.

Statistical Models of Overdispersed Spatial Defects for Predicting the Yield of Integrated Circuits.

Time-based replacement policies for a fault tolerant system subject to degradation and two types of shocks.

A multi-stage imperfect maintenance strategy for multi-state systems with variable user demands.

A Step-Down Test Procedure for Wavelet Shrinkage Using Bootstrapping.

Reliability assessment of a continuous-state fuel cell stack system with multiple degrading components.

A cost-driven reliability demonstration plan based on accelerated degradation tests.

Condition monitoring of a steam turbine generator using wavelet spectrum based control chart.

Reliability Prediction of Highly Scaled MOSFET Devices via Fractal Structure of Spatial Defects.

Bayesian Approach for Two-Phase Degradation Data Based on Change-Point Wiener Process With Measurement Errors.

Bayesian analysis of two-phase degradation data based on change-point Wiener process.

Data depth based support vector machines for predicting corporate bankruptcy.

A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides.

Remaining Useful Life Prediction of Lithium-Ion Batteries Based on Spherical Cubature Particle Filter.

A Bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns.

Bayesian degradation modeling for reliability prediction of organic light-emitting diodes.

Reliability Estimation from Linear Degradation and Failure Time Data With Competing Risks Under a Step-Stress Accelerated Degradation Test.

A Bayesian approach to modeling two-phase degradation using change-point regression.

Cost-effective degradation test plan for a nonlinear random-coefficients model.

A Constraint-based Maximum Entropy Sampling Method for Kriging Models in Fuel Cell Applications.

Change-point detection in failure intensity: A case study with repairable artillery systems.

A Genetic-Based Iterative Quantile Regression Algorithm for Analyzing Fatigue Curves.

Yield Prediction for Integrated Circuits Manufacturing Through Hierarchical Bayesian Modeling of Spatial Defects.

Bi-objective scheduling for reentrant hybrid flow shop using Pareto genetic algorithm.

Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation Tests.

Dual Features Functional Support Vector Machines for Fault Detection of Rechargeable Batteries.

Degradation Analysis of Nano-Contamination in Plasma Display Panels.

Generalized Linear Mixed Models for Reliability Analysis of Multi-Copy Repairable Systems.

Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices.

Degradation models and implied lifetime distributions.

A Nonlinear Random-Coefficients Model for Degradation Testing.