2003
ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume.
[DOI]
Harald P. E. Vranken
,
Friedrich Hapke
,
Soenke Rogge
,
Domenico Chindamo
,
Erik H. Volkerink
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003