2021
Simulation and Analysis on Influence Factors and Restraining Effect of Arc Over-voltage Amplitude in 10kV Network System.
Proceedings of the EEET 2021: 4th International Conference on Electronics and Electrical Engineering Technology, Nanjing, China, December 3, 2021

2020
Extend GO Methodology to Support Common-Cause Failures Modeling Explicitly by Means of Bayesian Networks.
IEEE Trans. Reliab., 2020

The test process date based quality defect detection strategy for spacecraft components.
Proceedings of the 7th International Conference on Dependable Systems and Their Applications, 2020