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2024
Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies.
[DOI]
Jaehoon Lee
,
Hyeonuk Son
,
Seohyun Kang
,
Dahyun Kang
,
Dongkwan Han
,
Jongsin Yun
,
Artur Pogiel
,
Etienne Racine
,
Krzysztof Jurga
,
Lori Schramm
,
Martin Keim
Proceedings of the IEEE International Test Conference, 2024