2023
Analysis of Intermittent Single-bit Failure on 10-nm node generation DRAM Devices.
[DOI]
Hyewon Seo
,
Taiuk Rim
,
Eunsun Lee
,
Sekyoung Jang
,
Kyosuk Chae
,
Jeonghoon Oh
,
Hyodong Ban
,
Jooyoung Lee
Proceedings of the IEEE International Reliability Physics Symposium, 2023