An efficient control variates method for yield estimation of analog circuits based on a local model.
Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012
Application-specific worst case corners using response surfaces and statistical models.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005
Degradation dynamics, recovery, and characterization of negative bias temperature instability.
Microelectron. Reliab., 2005