Ga2O3 Heterojunction PN Diodes with Suppressed Background Carrier Concentration for Improved Breakdown Voltage.
Proceedings of the Device Research Conference, 2023
Low frequency noise in MOS2 negative capacitance field-effect transistor.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Time Response of Polarization Switching in Ge Hafnium Zirconium Oxide Nanowire Ferroelectric Field-effect Transistors.
Proceedings of the 76th Device Research Conference, 2018