Cascode GaN Power Transistor Robust for Single Event Burnout Caused by Neutron Irradiation.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
650 Volt GaN: Highest Quality-Highest Performance Drives Market Ramp.
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Proceedings of the 2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2018
Commercialization and reliability of 600 V GaN power switches.
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Proceedings of the IEEE International Reliability Physics Symposium, 2015