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2009
Physical phenomena affecting performance and reliability of 4H-SiC bipolar junction transistors.
[DOI]
Peter G. Muzykov
,
Robert M. Kennedy
,
Qingchun Zhang
,
Craig Capell
,
Al Burk
,
Anant Agarwal
,
Tangali S. Sudarshan
Microelectron. Reliab., 2009