Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems.

Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment.

Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node.

Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology.

High-Current State triggered by Operating-Frequency Change.

Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node.

Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System.

Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology.

Analysis of advanced circuits for SET measurement.

Networking industry trends in ESD protection for high speed IOs.