×
2016
Thermal issues in test: An overview of the significant aspects and industrial practice.
[DOI]
Juergen Alt
,
Paolo Bernardi
,
Alberto Bosio
,
Riccardo Cantoro
,
Hans G. Kerkhoff
,
Andreas Leininger
,
Wolfgang Molzer
,
Alessandro Motta
,
Christian Pacha
,
Alberto Pagani
,
Alireza Rohani
,
R. Strasser
Proceedings of the 34th IEEE VLSI Test Symposium, 2016