Embedded PCM macro for automotive-grade microcontroller in 28nm FD-SOI.
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Proceedings of the 2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019, 2019
Analysis of the SET and RESET states drift of phase-change memories by low frequency noise measurements.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Carbon-doped Ge2Sb2Te5 phase-change memory devices featuring reduced RESET current and power consumption.
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Proceedings of the 2012 European Solid-State Device Research Conference, 2012