Write Recovery Time Degradation by Thermal Neutrons in DDR4 DRAM Components.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
Enabling power distribution network analysis flows for 3D ICs.
Proceedings of the IEEE International Conference on 3D System Integration, 2010
Pathfinding for 22nm CMOS designs using Predictive Technology Models.
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Proceedings of the IEEE Custom Integrated Circuits Conference, 2009
How will the fabless model survive?
Proceedings of the 43rd Design Automation Conference, 2006