Diagnosis of Voltage Dependent Scan Chain Failure Using VBUMP Scan Debug Method.
Proceedings of the 17th IEEE Asian Test Symposium, 2008
Current ratios: a self-scaling technique for production IDDQ testing.
Proceedings of the Proceedings IEEE International Test Conference 2000, 2000
Current ratios: a self-scaling technique for production I_DDQ testing.
Proceedings of the Proceedings IEEE International Test Conference 1999, 1999