Retention Characteristics Dependent on High-κ Gate-Insulator Stack in Hf-ZnO Synaptic Thin-Film Transistors.
IEEE Access, 2024
Weight-Update Characteristics Dependent on Carrier Densities of Hf-ZnO Charge-Trap Layers in Sub-Threshold Synaptic Transistors.
IEEE Access, 2024
A Low-Power Large-Language-Model Processor with Big-Little Network and Implicit-Weight-Generation for On-Device AI.
Proceedings of the 36th IEEE Hot Chips Symposium, 2024