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2023
Near Zero Field Magnetoresistance Spectroscopy: A New Tool in Semiconductor Reliability Physics.
[DOI]
Patrick M. Lenahan
,
E. B. Frantz
,
Sean W. King
,
Mark A. Anders
,
S. J. Moxim
,
James P. Ashton
,
Kyle J. Myers
,
M. E. Flatté
,
N. J. Harmon
Proceedings of the IEEE International Reliability Physics Symposium, 2023