A Comprehensive Study of Read-After-Write-Delay for Ferroelectric VNAND.
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Proceedings of the IEEE International Reliability Physics Symposium, 2024
Exploring Power Savings of Gate-All-Around Cryogenic Technology.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023
Diagnosis of Optical Lithography Faults With Product Test Sets.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008
Modeling of Deterministic Within-Die Variation in Timing Analysis, Leakage current Analysis, and Delay Fault Diagnosis.
PhD thesis, 2007
Impact on circuit performance of deterministic within-die variation in nanoscale semiconductor manufacturing.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006
Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models.
Microelectron. Reliab., 2005