Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes.
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Off-state stress degradation mechanism on advanced p-MOSFETs.
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The defect-centric perspective of device and circuit reliability - From individual defects to circuits.
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Proceedings of the 45th European Solid State Device Research Conference, 2015
Impact of Off State Stress on advanced high-K metal gate NMOSFETs.
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Impact of Al2O3 position on performances and reliability in high-k metal gated DRAM periphery transistors.
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Proceedings of the European Solid-State Device Research Conference, 2013
Positive bias temperature instabilities on sub-nanometer EOT FinFETs.
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