2015
Product-level reliability estimator with budget-based reliability management in 20nm technology.
[DOI]
Jae-Gyung Ahn
,
Ming Feng Lu
,
Nitin Navale
,
Dawn Graves
,
Ping-Chin Yeh
,
Jonathan Chang
,
S. Y. Pai
Proceedings of the IEEE International Reliability Physics Symposium, 2015