Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006
Linked faults in random access memories: concept, fault models, test algorithms, and industrial results.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004
2003 Technology Roadmap for Semiconductors.
Computer, 2004
Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests.
J. Electron. Test., 2003
Detecting Intra-Word Faults in Word-Oriented Memories.
Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003
March SL: A Test For All Static Linked Memory Faults.
Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003
2001 Technology Roadmap for Semiconductors.
Computer, 2002
Debating the Future of Burn-In.
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002
March SS: A Test for All Static Simple RAM Faults.
Proceedings of the 10th IEEE International Workshop on Memory Technology, 2002
ITRS Test Chapter 2001: We'll Tell You What We're Doing, You Tell Us What We Should Be Doing.
Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001
Realistic Fault Models and Test Procedures for Multi-Port SRAMs.
Proceedings of the 9th IEEE International Workshop on Memory Technology, 2001
Detecting Unique Faults in Multi-port SRAMs.
Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001
March Tests for Realistic Faults in Two-Port Memories.
Proceedings of the 8th IEEE International Workshop on Memory Technology, 2000
Defect screening challenges in the Gigahertz/Nanometer age: keeping up with the tails of defect behaviors.
Proceedings of the Proceedings IEEE International Test Conference 2000, 2000
Test of Future System-on-Chips.
Proceedings of the 2000 IEEE/ACM International Conference on Computer-Aided Design, 2000
Test challenges for deep sub-micron technologies.
Proceedings of the 37th Conference on Design Automation, 2000