A Cross-Layer Approach to Measure the Robustness of Integrated Circuits.
ACM J. Emerg. Technol. Comput. Syst., 2015
Monitoring of aging in integrated circuits by identifying possible critical paths.
Microelectron. Reliab., 2014
A compact model for NBTI degradation and recovery under use-profile variations and its application to aging analysis of digital integrated circuits.
Microelectron. Reliab., 2014
Robustness measurement of integrated circuits and its adaptation to aging effects.
Microelectron. Reliab., 2014
Efficiently analyzing the impact of aging effects on large integrated circuits.
Microelectron. Reliab., 2012
Schedulability Analysis for Processors with Aging-Aware Autonomic Frequency Scaling.
Proceedings of the 2012 IEEE International Conference on Embedded and Real-Time Computing Systems and Applications, 2012
Aging analysis at gate and macro cell level.
Proceedings of the 2010 International Conference on Computer-Aided Design, 2010