Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms.
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Proceedings of the IEEE International Reliability Physics Symposium, 2019
Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp.
Proceedings of the 31st Symposium on Integrated Circuits and Systems Design, 2018
Diagnose of radiation induced single event effects in a PLL using a heavy ion microbeam.
Proceedings of the 14th Latin American Test Workshop, 2013