A detailed comparison of various off-state breakdown methodologies for scaled Tri-gate technologies.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
Intel 4 CMOS Technology Featuring Advanced FinFET Transistors optimized for High Density and High-Performance Computing.
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
,
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022