Combining Built-In Redundancy Analysis with ECC for Memory Testing.
Proceedings of the IEEE European Test Symposium, 2024
Transitioning eMRAM from Pilot Project to Volume Production.
Proceedings of the IEEE International Test Conference, 2023
Memory repair logic sharing techniques and their impact on yield.
Proceedings of the IEEE International Test Conference, 2020
Implementing Design-for-Test Within a Tile-Based Design Methodology - Challenges and Solutions.
Proceedings of the IEEE International Test Conference in Asia, 2018