Technology Variability From a Design Perspective.
IEEE Trans. Circuits Syst. I Regul. Pap., 2011
Physically Justifiable Die-Level Modeling of Spatial Variation in View of Systematic Across Wafer Variability.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011
Measurement and Analysis of Variability in 45 nm Strained-Si CMOS Technology.
IEEE J. Solid State Circuits, 2009