2015
SOI FinFET soft error upset susceptibility and analysis.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014
The resilience wall: Cross-layer solution strategies.
Proceedings of the Technical Papers of 2014 International Symposium on VLSI Design, 2014

2008
New simulation methodology for effects of radiation in semiconductor chip structures.
IBM J. Res. Dev., 2008

Alpha-particle-induced upsets in advanced CMOS circuits and technology.
IBM J. Res. Dev., 2008

Preface.
IBM J. Res. Dev., 2008

Single-event-upset and alpha-particle emission rate measurement techniques.
IBM J. Res. Dev., 2008

1995
Electromigration and stress-induced voiding in fine Al and Al-alloy thin-film lines.
IBM J. Res. Dev., 1995