SOI FinFET soft error upset susceptibility and analysis.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
The resilience wall: Cross-layer solution strategies.
,
,
,
,
,
,
,
,
,
,
,
,
Proceedings of the Technical Papers of 2014 International Symposium on VLSI Design, 2014
New simulation methodology for effects of radiation in semiconductor chip structures.
IBM J. Res. Dev., 2008
Alpha-particle-induced upsets in advanced CMOS circuits and technology.
IBM J. Res. Dev., 2008
Single-event-upset and alpha-particle emission rate measurement techniques.
IBM J. Res. Dev., 2008
Electromigration and stress-induced voiding in fine Al and Al-alloy thin-film lines.
IBM J. Res. Dev., 1995