Error Bits Recovering in 3D NAND Flash Memory: A Novel State-Shift Re-Program (SRP) Scheme.
Proceedings of the IEEE International Conference on Integrated Circuits, 2023
One-shot Read Processing to Enhance Cold Data Retention in Charge-trap TLC 3D NAND Flash.
Proceedings of the 15th IEEE International Conference on ASIC, 2023
Large Suppression to Lateral Charge Migration (LCM) Related Error Bits in Charge-Trap TLC 3D NAND Flash.
Proceedings of the 2022 IEEE International Conference on Integrated Circuits, 2022