2022
Autoencoder-Based Data Sampling for Machine Learning-Based Lithography Hotspot Detection.
Proceedings of the 2022 ACM/IEEE Workshop on Machine Learning for CAD, 2022

2019
IP Session on Machine Learning Applications in IC Test-Related Tasks.
Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Machine Learning-Based Hotspot Detection: Fallacies, Pitfalls and Marching Orders.
Proceedings of the International Conference on Computer-Aided Design, 2019

2018
Innovative practices on machine learning for emerging applications.
Proceedings of the 36th IEEE VLSI Test Symposium, 2018

2016
Hotspot detection using machine learning.
Proceedings of the 17th International Symposium on Quality Electronic Design, 2016

2013
Layout regularity metric as a fast indicator of high variability circuits.
Proceedings of the 2013 IEEE International SOC Conference, Erlangen, Germany, 2013