2022
Impact of Phase-Change Memory Flicker Noise and Weight Drift on Analog Hardware Inference for Large-Scale Deep Learning Networks.
Adv. Intell. Syst., 2022

2018
Lateral profiling of HCI induced damage in ultra-scaled FinFET devices with Id-Vd characteristics.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

2016
Fully depleted SOI (FDSOI) technology.
Sci. China Inf. Sci., 2016

2012
Extremely thin SOI for system-on-chip applications.
Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012

2010
Fully depleted extremely thin SOI for mainstream 20nm low-power technology and beyond.
Proceedings of the IEEE International Solid-State Circuits Conference, 2010