2023
A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests.
[DOI]
D. Wieland
,
S. Ofner
,
M. Stabentheiner
,
B. Butej
,
Christian Koller
,
J. Sun
,
Andrea Minetto
,
K. Reiser
,
Oliver Häberlen
,
Michael Nelhiebel
,
Michael Glavanovics
,
Dionyz Pogany
,
Clemens Ostermaier
Proceedings of the IEEE International Reliability Physics Symposium, 2023