Low Temperature Characterization and Modeling of Hot Carrier Injection in 14 nm Si FinFET.
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Proceedings of the IEEE International Reliability Physics Symposium, 2024
Investigation of Read Disturb for Hf0.5Zr0.502 Ferroelectric Field-Effect Transistors Based Neuromorphic Applications.
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Proceedings of the IEEE International Reliability Physics Symposium, 2024
Hot Carrier Injection Induced Degradation of 14 nm FinFET under High Source-Drain Voltage Bias.
Proceedings of the IEEE International Conference on Integrated Circuits, 2024