2023
Testbench on a Chip: A Yield Test Vehicle for Resistive Memory Devices.
[DOI]
Luke R. Upton
,
Guénolé Lallement
,
Michael D. Scott
,
Joyce Taylor
,
Robert M. Radway
,
Dennis Rich
,
Mark Nelson
,
Subhasish Mitra
,
Boris Murmann
Proceedings of the 24th International Symposium on Quality Electronic Design, 2023