CmpCNN: CMP Modeling with Transfer Learning CNN Architecture.
ACM Trans. Design Autom. Electr. Syst., July, 2023
Corrigendum to "WDP-BNN: Efficient wafer defect pattern classification via binarized neural network" [Integration 85 (2022) 76-86].
Integr., 2023
Litho-NeuralODE 2.0: Improving hotspot detection accuracy with advanced data augmentation, DCT-based features, and neural ordinary differential equations.
Integr., 2022
WDP-BNN: Efficient wafer defect pattern classification via binarized neural network.
Integr., 2022