2020
Evolution of Defect in AlGaN-based Deep Ultraviolet Light Emitting Diodes During Electrical Stress.
[DOI]
Yingzhe Wang
,
Xuefeng Zheng
,
Jiaduo Zhu
,
Shengrui Xu
,
Xiaohua Ma
,
Jincheng Zhang
,
Yue Hao
,
Linlin Xu
,
Jiangnan Dai
,
Peixian Li
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020