2006

Application of three-parameter lognormal distribution in EM data analysis.

[DOI]

Baozhen Li

,

Emmanuel Yashchin

,

Cathryn Christiansen

,

Jason Gill

,

Ronald Filippi

,

Timothy D. Sullivan

Microelectron. Reliab., 2006

2003

Early reliability assessment by using deep censoring.

[DOI]

Harry A. Schafft

,

Linda M. Head

,

Jason Gill

,

Timothy D. Sullivan

Microelectron. Reliab., 2003