Mechanical and chemical adhesion at the encapsulant interfaces in laminated photovoltaic modules.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure.
Microelectron. Reliab., 2005
MTF test system with AC based dynamic joule correction for electromigration tests on interconnects.
Microelectron. Reliab., 2004
A new method for the analysis of high-resolution SILC data.
Microelectron. Reliab., 2003
Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology.
Microelectron. Reliab., 2002
Statistical aspects of the degradation of LDD nMOSFETs.
Microelectron. Reliab., 2002