2024
A Systematic Literature Review on Hardware Reliability Assessment Methods for Deep Neural Networks.
ACM Comput. Surv., June, 2024
Survey on Architectural Attacks: A Unified Classification and Attack Model.
ACM Comput. Surv., February, 2024
DeepVigor+: Scalable and Accurate Semi-Analytical Fault Resilience Analysis for Deep Neural Network.
CoRR, 2024
ProAct: Progressive Training for Hybrid Clipped Activation Function to Enhance Resilience of DNNs.
CoRR, 2024
Special Session: Reliability Assessment Recipes for DNN Accelerators.
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Proceedings of the 42nd IEEE VLSI Test Symposium, 2024
Heterogeneous Approximation of DNN HW Accelerators based on Channels Vulnerability.
Proceedings of the 32nd IFIP/IEEE International Conference on Very Large Scale Integration, 2024
Keynote: Cost-Efficient Reliability for Edge-AI Chips.
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Proceedings of the 25th IEEE Latin American Test Symposium, 2024
Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators.
Proceedings of the 25th International Symposium on Quality Electronic Design, 2024
Cost-Effective Fault Tolerance for CNNs Using Parameter Vulnerability Based Hardening and Pruning.
Proceedings of the 30th IEEE International Symposium on On-Line Testing and Robust System Design, 2024
AdAM: Adaptive Fault-Tolerant Approximate Multiplier for Edge DNN Accelerators.
Proceedings of the IEEE European Test Symposium, 2024
Special Session: In-Field ML-Assisted Intermittent Fault Localization and Management in RISC-V SoCs.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2024
Zero-Memory-Overhead Clipping-Based Fault Tolerance for LSTM Deep Neural Networks.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2024
SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators.
Proceedings of the 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems, 2024
ADAssure: Debugging Methodology for Autonomous Driving Control Algorithms.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024
Structural Decision Diagrams in Digital Test - Theory and Applications
Springer, ISBN: 978-3-031-44733-4, 2024
2023
Hybrid Protection of Digital FIR Filters.
IEEE Trans. Very Large Scale Integr. Syst., June, 2023
An automated method for mining high-quality assertion sets.
Microprocess. Microsystems, March, 2023
Special Session: Approximation and Fault Resiliency of DNN Accelerators.
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Proceedings of the 41st IEEE VLSI Test Symposium, 2023
DeepAxe: A Framework for Exploration of Approximation and Reliability Trade-offs in DNN Accelerators.
Proceedings of the 24th International Symposium on Quality Electronic Design, 2023
ML-Based Online Design Error Localization for RISC-V Implementations.
Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023
Fully-Fusible Convolutional Neural Networks for End-to-End Fused Architecture with FPGA Implementation.
Proceedings of the 30th IEEE International Conference on Electronics, Circuits and Systems, 2023
Adaptive Kalman Filter Based Data Aggregation in Fault-Resilient Underwater Sensor Networks.
Proceedings of the 24th International Conference on Digital Signal Processing, 2023
DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs' Reliability Assessment.
Proceedings of the IEEE European Test Symposium, 2023
Analysis and Improvement of Resilience for Long Short-Term Memory Neural Networks.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023
APPRAISER: DNN Fault Resilience Analysis Employing Approximation Errors.
Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2023
Enhancing Fault Resilience of QNNs by Selective Neuron Splitting.
Proceedings of the 5th IEEE International Conference on Artificial Intelligence Circuits and Systems, 2023
2022
Ransomware Attack as Hardware Trojan: A Feasibility and Demonstration Study.
IEEE Access, 2022
An Efficient Analog Convolutional Neural Network Hardware Accelerator Enabled by a Novel Memoryless Architecture for Insect-Sized Robots.
Proceedings of the 11th International Conference on Modern Circuits and Systems Technologies, 2022
High-Level Fault Diagnosis in RISC Processors with Implementation-Independent Functional Test.
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2022
IMMizer: An Innovative Cost-Effective Method for Minimizing Assertion Sets.
Proceedings of the 25th Euromicro Conference on Digital System Design, 2022
2021
Systematic Review of Fault Tolerant Techniques in Underwater Sensor Networks.
Sensors, 2021
Design Space Exploration of SABER in 65nm ASIC.
IACR Cryptol. ePrint Arch., 2021
A Methodology for Automated Mining of Compact and Accurate Assertion Sets.
Proceedings of the IEEE Nordic Circuits and Systems Conference, NorCAS 2021, Oslo, 2021
High-level Intellectual Property Obfuscation via Decoy Constants.
Proceedings of the 27th IEEE International Symposium on On-Line Testing and Robust System Design, 2021
Implementation-Independent Test Generation for a Large Class of Faults in RISC Processor Modules.
Proceedings of the 24th Euromicro Conference on Digital System Design, 2021
CLD: An Accurate, Cost-Effective and Scalable Run-Time Cache Leakage Detector.
Proceedings of the 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2021
Triple Fixed-Point MAC Unit for Deep Learning.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021
Side-Channel Attacks on Triple Modular Redundancy Schemes.
Proceedings of the 30th IEEE Asian Test Symposium, 2021
2020
Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs.
Microprocess. Microsystems, 2020
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors.
J. Electron. Test., 2020
NV-SP: A New High Performance and Low Energy NVM-Based Scratch Pad.
Proceedings of the 2020 IEEE Computer Society Annual Symposium on VLSI, 2020
An Efficient FPGA-based Architecture for Contractive Autoencoders.
Proceedings of the 28th IEEE Annual International Symposium on Field-Programmable Custom Computing Machines, 2020
LiD-CAT: A Lightweight Detector for Cache ATtacks.
Proceedings of the IEEE European Test Symposium, 2020
Data-Driven Cross-Layer Fault Management Architecture for Sensor Networks.
Proceedings of the 16th European Dependable Computing Conference, 2020
SCAAT: Secure Cache Alternative Address Table for mitigating cache logical side-channel attacks.
Proceedings of the 23rd Euromicro Conference on Digital System Design, 2020
Adjustable self-healing methodology for accelerated functions in heterogeneous systems.
Proceedings of the 23rd Euromicro Conference on Digital System Design, 2020
Implementation-Independent Functional Test for Transition Delay Faults in Microprocessors.
Proceedings of the 23rd Euromicro Conference on Digital System Design, 2020
A Security Verification Template to Assess Cache Architecture Vulnerabilities.
Proceedings of the 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2020
RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems.
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Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020
2019
Understanding multidimensional verification: Where functional meets non-functional.
Microprocess. Microsystems, 2019
Overview of Fault Tolerant Techniques in Underwater Sensor Networks.
CoRR, 2019
High-Level Combined Deterministic and Pseudoexhuastive Test Generation for RISC Processors.
CoRR, 2019
On Test Generation for Microprocessors for Extended Class of Functional Faults.
Proceedings of the VLSI-SoC: New Technology Enabler, 2019
Implementation-Independent Functional Test Generation for MSC Microprocessors.
Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019
Engineering of an Effective Automatic Dynamic Assertion Mining Platform.
Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019
Accelerating Transient Fault Injection Campaigns by using Dynamic HDL Slicing.
Proceedings of the 2019 IEEE Nordic Circuits and Systems Conference, 2019
Mixed-level identification of fault redundancy in microprocessors.
Proceedings of the IEEE Latin American Test Symposium, 2019
Software-Based Mitigation for Memory Address Decoder Aging.
Proceedings of the IEEE Latin American Test Symposium, 2019
IEEE European Test Symposium (ETS).
Proceedings of the IEEE International Test Conference, 2019
PASCAL: Timing SCA Resistant Design and Verification Flow.
Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019
Application Specific True Critical Paths Identification in Sequential Circuits.
Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019
Efficient Fault Injection based on Dynamic HDL Slicing Technique.
Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019
RTL Assertion Mining with Automated RTL-to-TLM Abstraction.
Proceedings of the 2019 Forum for Specification and Design Languages, 2019
An Accelerator-based Architecture Utilizing an Efficient Memory Link for Modern Computational Requirements.
Proceedings of the 2019 IEEE East-West Design & Test Symposium, 2019
High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors.
Proceedings of the 24th IEEE European Test Symposium, 2019
Fault-Aware Performance Assessment Approach for Embedded Networks.
Proceedings of the 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2019
New categories of Safe Faults in a processor-based Embedded System.
Proceedings of the 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2019
2018
Fast identification of true critical paths in sequential circuits.
Microelectron. Reliab., 2018
Design Understanding: From Logic to Specification<sup>*</sup>.
Proceedings of the IFIP/IEEE International Conference on Very Large Scale Integration, 2018
Upgrading QoSinNoC: Efficient Routing for Mixed-Criticality Applications and Power Analysis.
Proceedings of the IFIP/IEEE International Conference on Very Large Scale Integration, 2018
AWAIT: An Ultra-Lightweight Soft-Error Mitigation Mechanism for Network-on-Chip Links.
Proceedings of the 13th International Symposium on Reconfigurable Communication-centric Systems-on-Chip, 2018
Hierarchical Timing-Critical Paths Analysis in Sequential Circuits.
Proceedings of the 28th International Symposium on Power and Timing Modeling, 2018
Towards Multidimensional Verification: Where Functional Meets Non-Functional.
Proceedings of the 2018 IEEE Nordic Circuits and Systems Conference, 2018
Parallel Critical Path Tracing Fault Simulation in Sequential Circuits.
Proceedings of the 25th International Conference "Mixed Design of Integrated Circuits and System", 2018
Timing-critical path analysis with structurally synthesized BDDs.
Proceedings of the 7th Mediterranean Conference on Embedded Computing, 2018
A Hierarchical Approach for Devising Area Efficient Concurrent Online Checkers.
Proceedings of the IEEE International Test Conference in Asia, 2018
An Automatic Approach to Evaluate Assertions' Quality Based on Data-Mining Metrics.
Proceedings of the IEEE International Test Conference in Asia, 2018
Reliability Improvements for Multiprocessor Systems by Health-Aware Task Scheduling.
Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018
Software-Level TMR Approach for On-Board Data Processing in Space Applications.
Proceedings of the 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2018
QoSinNoC: Analysis of QoS-Aware NoC Architectures for Mixed-Criticality Applications.
Proceedings of the 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2018
From RTL Liveness Assertions to Cost-Effective Hardware Checkers.
Proceedings of the Conference on Design of Circuits and Integrated Systems, 2018
2017
Modeling and simulation of circuits with shared structurally synthesized BDDs.
Microprocess. Microsystems, 2017
Fault-resilient NoC router with transparent resource allocation.
Proceedings of the 12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip, 2017
High-level test generation for processing elements in many-core systems.
Proceedings of the 12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip, 2017
Comprehensive performance and robustness analysis of 2D turn models for network-on-chips.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017
Multi-Fragment Markov Model Guided Online Test Generation for MPSoC.
Proceedings of the 13th International Conference on ICT in Education, 2017
Automated area and coverage optimization of minimal latency checkers.
Proceedings of the 22nd IEEE European Test Symposium, 2017
A scalable technique to identify true critical paths in sequential circuits.
Proceedings of the 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2017
From online fault detection to fault management in Network-on-Chips: A ground-up approach.
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Proceedings of the 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2017
BASTION: Board and SoC test instrumentation for ageing and no failure found.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017
Resting EEG functional connectivity and graph theoretical measures for discrimination of depression.
Proceedings of the 2017 IEEE EMBS International Conference on Biomedical & Health Informatics, 2017
2016
Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits.
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J. Electron. Test., 2016
Holistic Approach for Fault-Tolerant Network-on-Chip based Many-Core Systems.
CoRR, 2016
Proceedings of the 2016 IFIP/IEEE International Conference on Very Large Scale Integration, 2016
SoCDep<sup>2</sup>: A framework for dependable task deployment on many-core systems under mixed-criticality constraints.
Proceedings of the 11th International Symposium on Reconfigurable Communication-centric Systems-on-Chip, 2016
A novel random approach to diagnostic test generation.
Proceedings of the IEEE Nordic Circuits and Systems Conference, 2016
Logic-based implementation of fault-tolerant routing in 3D network-on-chips.
Proceedings of the Tenth IEEE/ACM International Symposium on Networks-on-Chip, 2016
Gate-level modelling of NBTI-induced delays under process variations.
Proceedings of the 17th Latin-American Test Symposium, 2016
Designing reliable cyber-physical systems overview associated to the special session at FDL'16.
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Proceedings of the 2016 Forum on Specification and Design Languages, 2016
A synthesis-agnostic behavioral fault model for high gate-level fault coverage.
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016
Rejuvenation of NBTI-Impacted Processors Using Evolutionary Generation of Assembler Programs.
Proceedings of the 25th IEEE Asian Test Symposium, 2016
2015
Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebra.
Microprocess. Microsystems, 2015
Functional self-test of high-performance pipe-lined signal processing architectures.
Microprocess. Microsystems, 2015
Fault Collapsing in Digital Circuits Using Fast Fault Dominance and Equivalence Analysis with SSBDDs.
Proceedings of the VLSI-SoC: Design for Reliability, Security, and Low Power, 2015
Scalable algorithm for structural fault collapsing in digital circuits.
Proceedings of the 2015 IFIP/IEEE International Conference on Very Large Scale Integration, 2015
Automated minimization of concurrent online checkers for Network-on-Chips.
Proceedings of the 10th International Symposium on Reconfigurable Communication-centric Systems-on-Chip, 2015
Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuits.
Proceedings of the Nordic Circuits and Systems Conference, 2015
A Framework for Combining Concurrent Checking and On-Line Embedded Test for Low-Latency Fault Detection in NoC Routers.
Proceedings of the 9th International Symposium on Networks-on-Chip, 2015
Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG.
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Proceedings of the 16th Latin-American Test Symposium, 2015
Immortalizing many-core systems early experiences of the horizon 2020 action IMMORTAL.
Proceedings of the 2015 International Conference on High Performance Computing & Simulation, 2015
FSMD RTL design manipulation for clock interface abstraction.
Proceedings of the 2015 International Conference on Advances in Computing, 2015
A Framework for Comprehensive Automated Evaluation of Concurrent Online Checkers.
Proceedings of the 2015 Euromicro Conference on Digital System Design, 2015
SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic.
Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015
New Fault Models and Self-Test Generation for Microprocessors Using High-Level Decision Diagrams.
Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015
SystemC-Based Loose Models for Simulation Speed-Up by Abstraction of RTL IP Cores.
Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015
2014
Automated Design Error Localization in RTL Designs.
IEEE Des. Test, 2014
Hierarchical identification of NBTI-critical gates in nanoscale logic.
Proceedings of the 15th Latin American Test Workshop, 2014
Advanced technical education in the age of cyber physical systems.
Proceedings of the 10th European Workshop on Microelectronics Education (EWME), 2014
Diagnostic Test Generation for Statistical Bug Localization Using Evolutionary Computation.
Proceedings of the Applications of Evolutionary Computation - 17th European Conference, 2014
Logic simulation and fault collapsing with shared structurally synthesized bdds.
Proceedings of the 19th IEEE European Test Symposium, 2014
Critical Path Tracing Based Simulation of Transition Delay Faults.
Proceedings of the 17th Euromicro Conference on Digital System Design, 2014
2013
Automated design error debug using high-level decision diagrams and mutation operators.
Microprocess. Microsystems, 2013
At-speed self-testing of high-performance pipe-lined processing architectures.
Proceedings of the 2013 NORCHIP, Vilnius, Lithuania, November 11-12, 2013, 2013
Assessment of diagnostic test for automated bug localization.
Proceedings of the 14th Latin American Test Workshop, 2013
Performance analysis of cosimulating processor core in VHDL and SystemC.
Proceedings of the International Conference on Advances in Computing, 2013
Comparison of Model-Based Error Localization algorithms for C designs.
Proceedings of the East-West Design & Test Symposium, 2013
Synthesis of multiple fault oriented test groups from single fault test sets.
Proceedings of the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2013
Identifying NBTI-Critical Paths in Nanoscale Logic.
Proceedings of the 2013 Euromicro Conference on Digital System Design, 2013
Extensible open-source framework for translating RTL VHDL IP cores to SystemC.
Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013
2012
Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints.
J. Electron. Test., 2012
On the Reuse of TLM Mutation Analysis at RTL.
J. Electron. Test., 2012
A scalable model based RTL framework zamiaCAD for static analysis.
Proceedings of the 20th IEEE/IFIP International Conference on VLSI and System-on-Chip, 2012
Localization of Bugs in Processor Designs Using zamiaCAD Framework.
Proceedings of the 13th International Workshop on Microprocessor Test and Verification, 2012
About robustness of test patterns regarding multiple faults.
Proceedings of the 13th Latin American Test Workshop, 2012
PSL assertion checkers synthesis with ASM based HLS tool ABELITE.
Proceedings of the 13th Latin American Test Workshop, 2012
Diagnosis and correction of multiple design errors using critical path tracing and mutation analysis.
Proceedings of the 13th Latin American Test Workshop, 2012
Ultra-low latency NoC testing via pseudo-random test pattern compaction.
Proceedings of the 2012 International Symposium on System on Chip, 2012
Automated correction of design errors by edge redirection on High-Level Decision Diagrams.
Proceedings of the Thirteenth International Symposium on Quality Electronic Design, 2012
FoREnSiC- An Automatic Debugging Environment for C Programs.
Proceedings of the Hardware and Software: Verification and Testing, 2012
Combining dynamic slicing and mutation operators for ESL correction.
Proceedings of the 17th IEEE European Test Symposium, 2012
FP7 collaborative research project DIAMOND: Diagnosis, error modeling and correction for reliable systems design.
Proceedings of the 17th IEEE European Test Symposium, 2012
How to Prove that a Circuit is Fault-Free?
Proceedings of the 15th Euromicro Conference on Digital System Design, 2012
Multiple stuck-at-fault detection theorem.
Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012
Low-area boundary BIST architecture for mesh-like network-on-chip.
Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012
2011
Mutation analysis for SystemC designs at TLM.
Proceedings of the 12th Latin American Test Workshop, 2011
Interactive presentation abstract: Automated correction of design errors by edge redirection on high-level decision diagrams.
Proceedings of the 2011 IEEE International High Level Design Validation and Test Workshop, 2011
Automated test bench generation for high-level synthesis flow ABELITE.
Proceedings of the 9th East-West Design & Test Symposium, 2011
Constraint-Based Hierarchical Untestability Identification for Synchronous Sequential Circuits.
Proceedings of the 16th European Test Symposium, 2011
Fast RTL Fault Simulation Using Decision Diagrams and Bitwise Set Operations.
Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011
Defect-oriented module-level fault diagnosis in digital circuits.
Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011
Probabilistic equivalence checking based on high-level decision diagrams.
Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011
2010
Evolutionary Approach to Test Generation for Functional BIST
CoRR, 2010
Mutation analysis with high-level decision diagrams.
Proceedings of the 11th Latin American Test Workshop, 2010
Structural fault collapsing by superposition of BDDs for test generation in digital circuits.
Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010
Fault collapsing with linear complexity in digital circuits.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010
An approach for PSL assertion coverage analysis with high-level decision diagrams.
Proceedings of the 2010 East-West Design & Test Symposium, 2010
Structurally Synthesized Multiple Input BDDs for Speeding Up Logic-Level Simulation of Digital Circuits.
Proceedings of the 13th Euromicro Conference on Digital System Design, 2010
Fast Fault Simulation for Extended Class of Faults in Scan Path Circuits.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010
Constraint-based test pattern generation at the Register-Transfer Level.
Proceedings of the 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2010
Parallel X-fault simulation with critical path tracing technique.
Proceedings of the Design, Automation and Test in Europe, 2010
2009
Design-for-testability-based external test and diagnosis of mesh-like network-on-a-chips.
IET Comput. Digit. Tech., 2009
PSL Assertion Checking Using Temporally Extended High-Level Decision Diagrams.
J. Electron. Test., 2009
Diagnozer: A laboratory tool for teaching research in diagnosis of electronic systems.
Proceedings of the IEEE International Conference on Microelectronic Systems Education, 2009
Investigations of the diagnosibility of digital networks with BIST.
Proceedings of the 10th Latin American Test Workshop, 2009
High-Level Decision Diagrams based coverage metrics for verification and test.
Proceedings of the 10th Latin American Test Workshop, 2009
Structurally synthesized multiple input BDDs for simulation of digital circuits.
Proceedings of the 16th IEEE International Conference on Electronics, 2009
Block-Level Fault Model-Free Debug and Diagnosis in Digital Systems.
Proceedings of the 12th Euromicro Conference on Digital System Design, 2009
2008
Embedded fault diagnosis in digital systems with BIST.
Microprocess. Microsystems, 2008
Mixed hierarchical-functional fault models for targeting sequential cores.
J. Syst. Archit., 2008
Distributed Approach for Genetic Test Generation in the Field of Digital Electronics.
Proceedings of the Intelligent Distributed Computing, Systems and Applications, Proceedings of the 2nd International Symposium on Intelligent Distributed Computing, 2008
Reseeding using compaction of pre-generated LFSR sub-sequences.
Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, 2008
Temporally Extended High-Level Decision Diagrams for PSL Assertions Simulation.
Proceedings of the 13th European Test Symposium, 2008
Hierarchical Analysis of Short Defects between Metal Lines in CMOS IC.
Proceedings of the 11th Euromicro Conference on Digital System Design: Architectures, 2008
Hierarchical Calculation of Malicious Faults for Evaluating the Fault-Tolerance.
Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008
Code Coverage Analysis using High-Level Decision Diagrams.
Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), 2008
Web-Based Framework for Parallel Distributed Test.
Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), 2008
Untestable Fault Identification in Sequential Circuits Using Model-Checking.
Proceedings of the 17th IEEE Asian Test Symposium, 2008
Parallel fault backtracing for calculation of fault coverage.
Proceedings of the 13th Asia South Pacific Design Automation Conference, 2008
2007
FPGA-based fault emulation of synchronous sequential circuits.
IET Comput. Digit. Tech., 2007
Ultra Fast Parallel Fault Analysis on Structurally Synthesized BDDs.
Proceedings of the 12th European Test Symposium, 2007
Test Configurations for Diagnosing Faulty Links in NoC Switches.
Proceedings of the 12th European Test Symposium, 2007
Fault Diagnosis in Integrated Circuits with BIST.
Proceedings of the Tenth Euromicro Conference on Digital System Design: Architectures, 2007
Hierarchical Identification of Untestable Faults in Sequential Circuits.
Proceedings of the Tenth Euromicro Conference on Digital System Design: Architectures, 2007
Layout to Logic Defect Analysis for Hierarchical Test Generation.
Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), 2007
2006
Fault Simulation with Parallel Critical Path Tracing for Combinatorial Circuits Using Structurally Synthesized BDDs.
Proceedings of the 7th Latin American Test Workshop, 2006
High-Level Decision Diagram based Fault Models for Targeting FSMs.
Proceedings of the Ninth Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD 2006), 30 August, 2006
An External Test Approach for Network-on-a-Chip Switches.
Proceedings of the 15th Asian Test Symposium, 2006
2005
A New Testability Calculation Method to Guide RTL Test Generation.
J. Electron. Test., 2005
DOT: new deterministic defect-oriented ATPG tool.
Proceedings of the 10th European Test Symposium, 2005
Efficient Single-Pattern Fault Simulation on Structurally Synthesized BDDs.
Proceedings of the Dependable Computing, 2005
Defect-Oriented Test- and Layout-Generation for Standard-Cell ASIC Designs.
Proceedings of the Eighth Euromicro Symposium on Digital Systems Design (DSD 2005), 30 August, 2005
Improved Fault Emulation for Synchronous Sequential Circuits.
Proceedings of the Eighth Euromicro Symposium on Digital Systems Design (DSD 2005), 30 August, 2005
An Educational Environment for Digital Testing: Hardware, Tools, and Web-Based Runtime Platform.
Proceedings of the Eighth Euromicro Symposium on Digital Systems Design (DSD 2005), 30 August, 2005
2004
Web-Based Environment for Digital Electronics Test Tools.
Proceedings of the Virtual Enterprises and Collaborative Networks, IFIP 18th World Computer Congress, TC5 / WG5.5, 2004
Evaluating Fault Emulation on FPGA.
Proceedings of the Field Programmable Logic and Application, 2004
2003
Multiple-objective backtrace for solving test generation constraints.
Proceedings of the 2003 International Symposium on System-on-Chip, 2003
Testing Strategies for Networks on Chip.
Proceedings of the Networks on Chip, 2003
2002
Hierarchical test generation for combinational circuits with real defects coverage.
Microelectron. Reliab., 2002
Fast static compaction of tests composed of independent sequences: basic properties and comparison of methods.
Proceedings of the 2002 9th IEEE International Conference on Electronics, 2002
Multi-Level Fault Simulation of Digital Systems on Decision Diagrams.
Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002
Internet-Based Collaborative Test Generation with MOSCITO.
Proceedings of the 2002 Design, 2002
2001
Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement.
Microelectron. Reliab., 2001
Defect-Oriented Fault Simulation and Test Generation in Digital Circuits.
Proceedings of the 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 2001
2000
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations.
J. Electron. Test., 2000
Efficient Hierarchical Approach to Test Generation for Digital Systems.
Proceedings of the 1st International Symposium on Quality of Electronic Design (ISQED 2000), 2000
Back-tracing and event-driven techniques in high-level simulation with decision diagrams.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2000
Hierarchical defect-oriented fault simulation for digital circuits.
Proceedings of the 5th European Test Workshop, 2000
Cycle-Based Simulation Algorithms for Digital Systems Using High-Level Decision Diagrams.
Proceedings of the 2000 Design, 2000
1999
High-level path activation technique to speed up sequential circuit test generation.
Proceedings of the 4th European Test Workshop, 1999
Cycle-based Simulation with Decision Diagrams.
Proceedings of the 1999 Design, 1999
Sequential Circuit Test Generation Using Decision Diagram Models.
Proceedings of the 1999 Design, 1999
1997
Exploiting High-Level Descriptions for Circuits Fault Tolerance Assessments.
Proceedings of the 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 1997