2015
Thermal activation of PBTI-related stress and recovery processes in GaN MIS-HEMTs using on-wafer heaters.
[DOI]
Peter Lagger
,
S. Donsa
,
P. Spreitzer
,
Gregor Pobegen
,
M. Reiner
,
H. Naharashi
,
J. Mohamed
,
H. Mosslacher
,
G. Prechtl
,
Dionyz Pogany
,
Clemens Ostermaier
Proceedings of the IEEE International Reliability Physics Symposium, 2015