Soft Error Performance of High-Speed Pulsed-DICE-Latch Design in 16 nm and 7 nm FinFET Processes.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Scaling trends and bias dependence of the soft error rate of 16 nm and 7 nm FinFET SRAMs.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Analysis of Time Delay Attacks against Power Grid Stability.
Proceedings of the 2nd Workshop on Cyber-Physical Security and Resilience in Smart Grids, 2017
Space-alternating generalised expectation-maximisation-based h-infinity channel estimator for multiple-input multiple-output-orthogonal frequency division multiplexing systems.
IET Commun., 2011