EMI-Related Common-Mode (CM) Noise Analysis and Prediction of High-Speed Source-Series Terminated (SST) I/O Driver in System-on-Package (SOP).
IEEE Trans. Circuits Syst. II Express Briefs, 2018
EMI common-mode (CM) noise suppression from self-calibration of high-speed SST driver using on-chip process monitoring circuit.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017
Dynamic multi-parameter response model for SEED analysis.
Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015