Keynote: Cost-Efficient Reliability for Edge-AI Chips.
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Proceedings of the 25th IEEE Latin American Test Symposium, 2024
Special Session: In-Field ML-Assisted Intermittent Fault Localization and Management in RISC-V SoCs.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2024
ML-Based Online Design Error Localization for RISC-V Implementations.
Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023
JÄNES: A NAS Framework for ML-based EDA Applications.
Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021
Wafer-Level Die Re-Test Success Prediction Using Machine Learning.
Proceedings of the IEEE Latin-American Test Symposium, 2020