Relationship of trustworthiness and relational benefit in electronic catalog markets.
Electron. Mark., 2014
Analysis of the Effect of LUT Size on FPGA Area and Delay Using Theoretical Derivations.
Proceedings of the 6th International Symposium on Quality of Electronic Design (ISQED 2005), 2005
Testing for Resistive Shorts in FPGA Interconnects.
Proceedings of the 6th International Symposium on Quality of Electronic Design (ISQED 2005), 2005