Low-Noise Quality Factor Tuning in Nondegenerate MEMS Gyroscope Without Dedicated Tuning Electrode.
IEEE Trans. Ind. Electron., April, 2024
Low Noise Temperature Compensation Strategy for North-finding MEMS Gyroscope.
Proceedings of the 2024 IEEE SENSORS, Kobe, Japan, October 20-23, 2024, 2024
Expanding Bias-instability of MEMS Silicon Oscillating Accelerometer Utilizing AC Polarization and Self-Compensation.
Sensors, 2020
A Sub-0.1°/h Bias-Instability Split-Mode MEMS Gyroscope With CMOS Readout Circuit.
IEEE J. Solid State Circuits, 2018
An Ultra-Low-Power Third-Order Frequency-to-Digital Converter for FM MEMS Gyroscope.
Proceedings of the 2018 IEEE SENSORS, New Delhi, India, October 28-31, 2018, 2018
A 0.23-µg Bias Instability and 1-µg/√Hz Acceleration Noise Density Silicon Oscillating Accelerometer With Embedded Frequency-to-Digital Converter in PLL.
IEEE J. Solid State Circuits, 2017
A 0.4 µg Bias Instability and 1.2 µg Hz Noise Floor MEMS Silicon Oscillating Accelerometer With CMOS Readout Circuit.
IEEE J. Solid State Circuits, 2017
A 0.23 µg bias instability and 1.6 µg/Hz<sup>1/2</sup> resolution silicon oscillating accelerometer with build-in Σ-Δ frequency-to-digital converter.
Proceedings of the 2016 IEEE Symposium on VLSI Circuits, 2016
Thermal drift optimization for silicon microgyroscope.
Proceedings of the 2016 IEEE SENSORS, Orlando, FL, USA, October 30 - November 3, 2016, 2016
An on-chip thermal stress evaluation method for silicon resonant accelerometer.
Proceedings of the 2016 IEEE SENSORS, Orlando, FL, USA, October 30 - November 3, 2016, 2016
A Sub-µg Bias-Instability MEMS Oscillating Accelerometer With an Ultra-Low-Noise Read-Out Circuit in CMOS.
IEEE J. Solid State Circuits, 2015
27.2 A1.2μg/√Hz-resolution 0.4μg-bias-instability MEMS silicon oscillating accelerometer with CMOS readout circuit.
Proceedings of the 2015 IEEE International Solid-State Circuits Conference, 2015
A 0.57°/h bias instability 0.067°/√h angle random walk MEMS gyroscope with CMOS readout circuit.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2015