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2024
A Hybrid Deep Learning-Based Framework for Chip Packaging Fault Diagnostics in X-Ray Images.
[DOI]
Jie Wang
,
Gaomin Li
,
Haoyu Bai
,
Guixin Yuan
,
Xuan Li
,
Bin Lin
,
Lijun Zhong
,
Xiaohu Zhang
IEEE Trans. Ind. Informatics, September, 2024