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2000
Computer-aided fault to defect mapping (CAFDM) for defect diagnosis.
[DOI]
Zoran Stanojevic
,
Hari Balachandran
,
D. M. H. Walker
,
Fred Lakbani
,
Jayashree Saxena
,
Kenneth M. Butler
Proceedings of the Proceedings IEEE International Test Conference 2000, 2000