How Many Test Patterns are Useless?
Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008
Classifying Bad Chips and Ordering Test Sets.
Proceedings of the 2006 IEEE International Test Conference, 2006
ELF-Murphy Data on Defects and Test Sets.
Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004