×
2022
Nanoscale Analysis of Breakdown Induced Crack Propagation in DTSCR Devices.
[DOI]
Xinqian Chen
,
Fei Hou
,
Zuoyuan Dong
,
Yuxin Zhang
,
Chaolun Wang
,
Fang Liang
,
Feibo Du
,
Zhiwei Liu
,
Xing Wu
Proceedings of the IEEE International Reliability Physics Symposium, 2022