Thermoreflectance property of gallium nitride.

Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems.

Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy.

Transient dual interface measurement of junction-to-case thermal resistance in AlGaN/GaN HEMT utilizing an improved infrared microscope.